Towards a deeper understanding of carbon fiber microstructure via small angle X-ray scattering
발표자
최지호 (숭실대학교)
연구책임자
최지호 (숭실대학교)
공동저자
최지호 (숭실대학교)
초록
내용
Understanding microstructure of carbon fiber is essential for establishing processing–structure–property linkages. Conventional methods (XRD, Raman, TEM) often yield partial views, making a unified microstructural sketch challenging. Small-angle X-ray scattering (SAXS) complements these by providing statistically representative descriptors of voids and crystallites. We present a SAXS-based workflow across four manufacturing stages: PAN stabilization, pitch carbonization, PAN carbonization, and PAN oxidation. SAXS resolves void origins during stabilization, captures domain-to-crystallite transformation in pitch fibers, reveals master-curves linking modulus to crystallite growth, and quantifies radial heterogeneity. Overall, SAXS integrates disparate measures into a coherent, process-linked sketch, enabling the rational optimization of carbon fibers and composites.