Perovskite Electric Properties via Pulsed-Voltage Space-Charge-Limited Current Measurements
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초록
내용
The space-charge-limited current (SCLC) method has been widely used to investigate the electric properties of metal-halide perovskite materials by analyzing the current density-voltage (J-V) curve. However, its interpretation became complicated due to its mixed ionic and electronic nature. In this study, we utilized the pulsed voltage space charge limited current (PV-SCLC) method to accurately determine the electric properties of metal-halide perovskite thin films, such as conductivity, carrier mobility, and trap densities. We observed overlapped curves in the forward and reverse scans of the J-V traces measured in the specified voltage range of the hybrid perovskite thin films. Additionally, this study revealed that the electric properties of perovskite films remain consistent regardless of the presence or absence of charge transport layers and the type of charge transport layers used. We have concluded that PV-SCLC measurements are a novel and accurate method for investigating the intrinsic transport characteristics of hybrid perovskites in thin film form.