Nanoscale IR Imaging and Spectroscopic Characterization of Polymer Nanocomposites Using s-SNOM
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초록
내용
Scattering-type Scanning Near-field Optical Microscopy (s-SNOM) is a scanning probe approach to optical microscopy and spectroscopy bypassing the diffraction limit of light to achieve a spatial resolution below 20 nanometers. By analyzing single frequency or broadband IR radiation, scattered from a sharp metallic AFM tip, s-SNOM allows for nanoscale imaging and broadband nano-FTIR spectroscopy. We have used s-SNOM imaging and nano-FTIR spectroscopy to identify and map sub-micrometer sized domains in a PS-LDPE blend. Further, this technique can be used to investigate the location, size, and distribution of components in more complex structures, as a first step to correlate material properties to their nanoscale composition. This will be demonstrated on the nanoscale chemical composition of rubber materials, conformation mapping in polymer brush materials as well as the possibility to gather nanoscale IR spectra from materials at different depths in layered systems.