Join

Program Scientific Program
POS2-0639

Additive-Induced Segmental Dynamics in PR-like Polymer Thin Films Probed by Broadband Dielectric Spectroscopy

Topic

S2. High-End Characterization/Polymer Physics/Properties

When and Where

Sep 29, 2026   08:30 - 09:30
Room 301 (Grand Ballroom)

Session Chairs

Hae Jung SON
Boseok KANG

Presenter(s)

seongeun kim (Seoul national university)

Co-Author(s)

soyoun kim (Seoul national university)

Abstract

 As extreme ultraviolet lithography advances toward the high-NA regime, photoresist (PR) films must satisfy stricter requirements to enhance resolution and line-edge roughness. Achieving these performance targets requires precise control of acid diffusion and reaction uniformity, but additive distribution and local polymer dynamics can introduce dynamic heterogeneity, making such control difficult in multicomponent chemically amplified resist (CARs). To address this complexity, broadband dielectric spectroscopy (BDS) is used to probe dynamic heterogeneity in PR-like polymer films. BDS monitors the frequency- and temperature-dependent dielectric response of polymer dipoles, allowing segmental relaxation and molecular mobility to be evaluated. However, direct incorporation of actual PAGs and quenchers can complicate experimental dielectric analysis because their ionic or highly polar nature may increase conductivity and electrode polarization. Therefore, a simplified PR-like formulation is designed using poly(4-vinylphenol-co-methyl methacrylate) (PHS-co-PMMA) and non-ionic model additives. The PHS units contain CAR-relevant phenolic hydroxyl groups that can interact with additives, leading to local mobility constraints and dynamic heterogeneity. In contrast, the methacrylate units provide a relatively non-reactive environment, allowing PHS-specific additive interactions to be distinguished from general additive-induced effects. This model formulation enables clearer dielectric interpretation of reaction-driven changes in segmental dynamics. BDS, together with FTIR, ellipsometry, and solvent-resistance analysis, is used to verify whether additives induce chemical interactions or crosslinking and how these changes affect film stability, glass transition behavior, and segmental dynamics. By probing changes in segmental dynamics, this study provides a model framework for understanding and addressing dynamic heterogeneity in high-NA PR materials.
Supported by
Korea Tourism Organization BUSAN TOURISM ORGANIZATION
Sponsored by
DONGWOO FINE-CHEM Co., Ltd. Korea Research Institute of Chemical Technology Advanced Materials Division Sejin CI DONGJIN SEMICHEM HAEDONG SCIENCE FOUNDATION COSMAX EcoProBM Young Eng. Sci. Doosan SAMSUNG SDI S-OIL 한국도레이과학진흥재단