POS6-1485
Characterization of Photophysical Properties in Sub-Micron Perovskite Single-Crystal Thin Films
When and Where
Nov 30, -0001
00:00 - 00:00
Room 301 (Grand Ballroom)
Presenter(s)
Junmo Park (Gwangju Institute of Science and Technology)
Co-Author(s)
Abstract
Polycrystalline (PC) perovskites have been widely investigated for optoelectronic applications owing to their outstanding photophysical properties, including tunable bandgaps, high absorption coefficients, and high carrier mobilities. However, defects in PC perovskites induce trap states that facilitate non-radiative recombination and provide pathways for ion migration, thereby degrading device performance and material stability. To address these issues, single-crystalline (SC) perovskites with intrinsically low defect densities have been explored as a promising alternative.
Space-confined inverse temperature crystallization has been widely employed to synthesize SC perovskite thin films. However, the thickness of single-crystal thin films synthesized by this method typically exceeds 1 μm. Despite the low trap density inherent to SC perovskites, excessive thickness can result in inefficient charge confinement, thereby inducing charge dissociation and inefficient radiative recombination. In contrast, sub-micron SC perovskite films are expected to enable efficient charge confinement, making them attractive candidates for efficient and stable light-emitting applications.
Herein, we demonstrate SC perovskite films with thicknesses down to the sub-micron scale by controlling the pressure applied to the confining substrates. Systematic characterization was conducted with varying thickness to investigate the optical properties of the resulting films. Notably, reducing film thickness improves the luminescent properties. These results suggest the potential of sub-micron SC perovskite thin films as emitters for next-generation light-emitting devices
Space-confined inverse temperature crystallization has been widely employed to synthesize SC perovskite thin films. However, the thickness of single-crystal thin films synthesized by this method typically exceeds 1 μm. Despite the low trap density inherent to SC perovskites, excessive thickness can result in inefficient charge confinement, thereby inducing charge dissociation and inefficient radiative recombination. In contrast, sub-micron SC perovskite films are expected to enable efficient charge confinement, making them attractive candidates for efficient and stable light-emitting applications.
Herein, we demonstrate SC perovskite films with thicknesses down to the sub-micron scale by controlling the pressure applied to the confining substrates. Systematic characterization was conducted with varying thickness to investigate the optical properties of the resulting films. Notably, reducing film thickness improves the luminescent properties. These results suggest the potential of sub-micron SC perovskite thin films as emitters for next-generation light-emitting devices
