INS2-1477
Advanced Synchrotron X-ray Diffraction Characterization of Perovskite Films: From 2D Structural Mapping to Grazing-Incidence and Angle-Dependent Analyses
Topic
S2. High-End Characterization/Polymer Physics/Properties
When and Where
Sep 30, 2026
12:00 - 12:25
Room 103
Session Chairs
Keiji TANAKA
Presenter(s)
Tae Joo Shin (Ulsan National Institute of Science and Technology (UNIST))
Co-Author(s)
Abstract
The rapid advancement of hybrid organic-inorganic perovskites (HOIPs) for next-generation photovoltaics and electronics demands precise evaluation of their macroscale structural properties. Translating laboratory-scale success into large-area devices or high-quality single-crystalline thin films requires advanced non-destructive characterization tools. These tools must resolve spatial heterogeneities, grain orientations, and lattice behaviors. This presentation highlights two advanced synchrotron-based X-ray diffraction (XRD) methodologies developed to probe the complex structural landscapes of perovskite materials. First, an intact-film orthogonal two-dimensional X-ray diffraction mapping (2DXDM) technique is introduced. Implemented at the PLS-II 6D UNIST-PAL beamline, this high-throughput platform evaluates large-area modules up to 225 cm² without physical sectioning. By utilizing a dual-scan rotation scheme, 2DXDM resolves spatial variations in crystallinity, orientation coherence, and localized lattice strain, thereby enabling a direct full-field correlation between crystallographic homogeneity and photovoltaic performance. Second, ω-dependent grazing-incidence X-ray diffraction (ω-GIXRD) is presented as a method to rigorously verify the single-crystallinity of 2D HOIP films grown on SiO₂/Si. Continuous in-plane sample rotation tracks the full orientation distribution, distinguishing ideal single-crystalline frameworks from multi-domain twist structures by capturing discrete, spotty diffraction peaks along the Ewald sphere. Collectively, these high-end synchrotron techniques establish a comprehensive diagnostic framework. They bridge the gap between microscopic crystallographic structures and macroscopic device performances, accelerating the scalable manufacturing of perovskite optoelectronics.
